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Product for overseas customers
FASTGATE provides high performance products to overseas customers.
YGK
New Technology
YPI-MX-DC
[ Dual Heads Particle Scanner ]
It's not limited to SiC, can aiso measure transparent glass wafer, the silicon wafer.
EMinimum detection particle size : 0.1m.
EThe measurement within 5 minutes, including the latent flaw detection measurement of 4 inches SiC wafer.
YGK : HP

YPI-MX-DC
YPI-MN
Small particle surface scanner equipped with a new small particle sensor.
Possible measurement of transparent glass substrate.
YGK : HP

YPI-MN

YPI-100
Glass plate particle inspection system
ESilicon wafers, glass plates, etc.
EMinimum detectable particle size : 0.5m.
YGK : HP

YPI-100

YPI-200
Transparent substrate particle inspection system
ESimple operation.
EDesktop type.
EMinimum detectable particle size : 0.152m.
YGK : HP

YPI-200
Glass Substrate
YPI-MX-XYA
YPI-MX-A
Top and back isolation(Automatic)
EAvailable for separating front and back with autofocus sensor.
EMinimum detection particle size : Quartz 0.2m.
ETestable substrate:Quartz, Sapphires, SiC substrates, Sic substrates with epitaxial layer, etc.
YGK : HP

YPI-MX-XYA

YPI-MX-XY
YPI-MX-
Top and back isolation(Manual)
EAvailable for separating front and back with autofocus sensor.
EMinimum detection particle size : Quartz 0.2m.
ETestable substrate:Quartz, Sapphires, SiC substrates, Sic substrates with epitaxial layer, etc.
YGK : HP

YPI-MX-XY
Sillicon Wafer
YPI-N-XYA
YPI-MX-XA
Available for mirror substrate(sillicon wafers, etc.)
EHigh speed scanning.
ESubstrate size : 2`8 inch
EMinimum detection particle size : Si wafers : 0.1m.
ETestable substrate:Si wafers, Variety of wafers with films.
YGK : HP

YPI-N-XYA

YPI-N-XY
YPI-N-
Available for mirror substrate(sillicon wafers, etc.)
EHigh speed scanning.
ESubstrate size : 2`8 inch
EMinimum detection particle size : Si wafers : 0.1m.
ETestable substrate:Si wafers, Variety of wafers with films.
YGK : HP

YPI-N-XY
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