FAST GATE Japanese
TOP Domestic sales Overseas Business Partners Customers Exhibition Corporate Information
Product Overseas Business
Product for overseas customers
FASTGATE provides high performance products to overseas customers.
YGK
New Technology
YPI-MX-É∆DC
[ Dual Heads Particle Scanner ]
It's not limited to SiC, can aiso measure transparent glass wafer, the silicon wafer.
ĀEMinimum detection particle size : 0.1É m.
ĀEThe measurement within 5 minutes, including the latent flaw detection measurement of 4 inches SiC wafer.
YGK : HP

YPI-MX-É∆DC
YPI-MN
Small particle surface scanner equipped with a new small particle sensor.
Possible measurement of transparent glass substrate.
YGK : HP

YPI-MN

YPI-100
Glass plate particle inspection system
ĀESilicon wafers, glass plates, etc.
ĀEMinimum detectable particle size : 0.5É m.
YGK : HP

YPI-100

YPI-200
Transparent substrate particle inspection system
ĀESimple operation.
ĀEDesktop type.
ĀEMinimum detectable particle size : 0.152É m.
YGK : HP

YPI-200
Glass Substrate
YPI-MX-XYA
YPI-MX-É∆A
Top and back isolation(Automatic)
ĀEAvailable for separating front and back with autofocus sensor.
ĀEMinimum detection particle size : Quartz 0.2É m.
ĀETestable substrate:Quartz, Sapphires, SiC substrates, Sic substrates with epitaxial layer, etc.
YGK : HP

YPI-MX-XYA

YPI-MX-XY
YPI-MX-É∆
Top and back isolation(Manual)
ĀEAvailable for separating front and back with autofocus sensor.
ĀEMinimum detection particle size : Quartz 0.2É m.
ĀETestable substrate:Quartz, Sapphires, SiC substrates, Sic substrates with epitaxial layer, etc.
YGK : HP

YPI-MX-XY
Sillicon Wafer
YPI-N-XYA
YPI-MX-É∆XA
Available for mirror substrate(sillicon wafers, etc.)
ĀEHigh speed scanning.
ĀESubstrate size : 2Ā`8 inch
ĀEMinimum detection particle size : Si wafers : 0.1É m.
ĀETestable substrate:Si wafers, Variety of wafers with films.
YGK : HP

YPI-N-XYA

YPI-N-XY
YPI-N-É∆
Available for mirror substrate(sillicon wafers, etc.)
ĀEHigh speed scanning.
ĀESubstrate size : 2Ā`8 inch
ĀEMinimum detection particle size : Si wafers : 0.1É m.
ĀETestable substrate:Si wafers, Variety of wafers with films.
YGK : HP

YPI-N-XY
FASTGATE CORPORATION Copyright(c)2017 FASTGATE, CORPORATION all rights reserved